Schlagwort: SS Elec.

Dopant segregation effects on ohmic contact formation in nanoscale silicon

Solid-State Electronics
>10.1016/j.sse.2023.108739

Reliability characterization of non-hysteretic charge amplification in MFIM device

Solid-State Electronics
>10.1016/j.sse.2023.108721

Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions

Solid-state electronics
>10.1016/j.sse.2022.108569

Three-to-one analog signal modulation with a single back-bias-controlled reconfigurable transistor

Nature Communications
>10.1038/s41467-022-34533-w

Versatile experimental setup for FTJ characterization

Solid-State Electronics
>10.1016/j.sse.2022.108364